Posts

Showing posts with the label Consumer Electronics

Cyclocomputer: Unleashing the Power of Data How a Cycle computer Enhances Cycling Experience

Image
Cyclocomputer History of Cyclocomputer The invention of the cycle computer can be traced back to the late 1970s when the first basic bicycle computers were released that were able to track distance and speed. These early computers used basic button cell batteries and simple LCD displays. Through the 80s and 90s, cycle computers became more advanced, incorporating features like avg speed, max speed, trip distance, total distance, and GPS functionality. By the early 2000s, cycle computers had become a standard bike accessory with computers offering ANT+ and Bluetooth connectivity for sensors, maps, leaderboards and more. Today's modern cycle computers are truly multifunction computers capable of advanced training metrics, navigation, and smartphone integration. Distance Tracking One of the basic yet essential functions of any Cyclocomputer is accurate distance tracking. As you ride, the computer uses its internal sensors to continuously calculate distance traveled based on wheel r...

Exploring The World Of Atomic Force Microscope and its Revolutionary Role in Nanotechnology

Image
  Atomic Force Microscope History and Development The atomic force microscope (AFM) was developed in 1986 by Gerd Binnig, Calvin Quate and Christopher Gerber at Stanford University. It was invented as a sharp tip was scanned across a surface at very close proximity, providing images with atomic resolution. The first prototype AFM could image individual atoms on a graphite surface for the first time. In the coming years, it became an important tool in nanotechnology for its unique ability to image surfaces under liquids and in ambient conditions down to the molecular and atomic scale. Several other improvements were made to enhance its sensitivity and utility for various applications. Working Principle In an Atomic Force Microscope , a microscale cantilever with a sharp probing tip at its end is used to scan the specimen surface. The cantilever is typically made of silicon or silicon nitride with a tip radius of curvature on the order of nanometres. A detector measures the de...